ESD in Silicon Integrated Circuits

Electrostatic Discharge (ESD) effects in silicon integrated circuits have become a major concern as todays high circuit density technologies shrink to sub-micro dimensions. This book provides an understanding of the basic features related to ESD and deals with topics ranging from the physics of devices operating under ESD conditions to approaches for solving and improving ESD performance in advanced ICs. Features include:

• Description of the methods used to reproduce ESD-type events in a controlled test environment

• Analysis of the behavior of different semiconductor devices under ESD conditions, including the physics and modeling of devices

• Detailed study of design and layout requirements for ESD protection circuits

• Case studies showing examples of approaches to solving ESD design problems, including failure analysis

Covering the state-of-the-art in circuit design for ESD prevention, this practical book is written from an industrial perspective and will appeal to engineers and scientists working in the fields of IC and transistor design. Researchers and advanced students in the fields of device/circuit modeling and semiconductor reliability, seeking to understand the fundamentals of ESD phenomena, will also find this book an invaluable reference source.