Electrical Characterization of Organic Electronic Materials and Devices
* Gives new insights into the electronic properties and measurement techniques for low-mobility electronic devices
* Characterizes the thin-film transistor using its own model
* Links the phenomena seen in different device structures and different measurement techniques
* Presents clearly both how to perform electrical measurements of organic and low-mobility materials and how to extract important information from these measurements
* Provides a much-needed theoretical foundation for organic electronics
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